Advanced DFT infrastructure
Tessent ScanPro provides advanced scan DFT features that maximize the performance of scan-based test solutions such as those provided by the Tessent TestKompress, Tessent FastScan and Tessent LogicBIST products.
Key Features:
- All of the scan integration features available in Tessent Scan
- VersaPoint test point technology for improved ATPG compression and logic BIST coverage
- Optional Observation Scan Technology (OST) for significant reduction in logic BIST pattern count
- On-chip clock control (OCC) insertion
- X-bounding for logic BIST
