Comprehensive boundary scan and I/O test
The Tessent BoundaryScan is a complete solution for automated generation and integration of on-chip test infrastructure, boundary scan, and test access port. Tessent BoundaryScan provides adds standard boundary scan support to ICs of any size or complexity, reducing IC engineering development effort and time-to-market.
Tessent BoundaryScan supports standard 1149.1 boundary scan cells, 1149.1 and 1149.6 custom cells, and optionally, 1149.6 cells AC-coupled and/ or differential I/O cells. It also provides a unique 1149.1-based solution for contactless testing of I/Os.
Key Features:
- Complete boundary scan and TAP controller integration
- Hierarchical RTL integration
- Automated rule checking
- Interactive debug
- Verification test benches
- Manufacturing test patterns
- Support for both 1149.1 and 1149.6 standards
- Supports multi-TAP, multi chip package BSDL, and 3rd party IP with embedded I/Os and Bscan cells
- Enables contactless I/O test
- IIL/IIH/VOL/VOH parametric tests
- Automated BSDL generation enables board-level interconnect test and diagnosis
